DocumentCode :
2688082
Title :
Physics-based bipolar transistor model for low-temperature circuit simulation
Author :
Liou, J.J. ; Yuan, J.S.
fYear :
1989
fDate :
15-18 May 1989
Abstract :
A comprehensive bipolar transistor model based on the Gummel-Poon model for low-temperature circuit simulation is presented. Low-temperature physical properties such as doping-dependent dielectric permittivity, temperature-dependent free-carrier mobility and intrinsic carrier density, and deionization of impurity dopants are included in the model. Consequently, the model does not require temperature-fitting parameters as does the Gummel-Poon model. Comparisons of the present model with the Gummel-Poon model, with experimental data, and with PISCES two-dimensional device simulation are included
Keywords :
bipolar transistors; carrier density; carrier mobility; permittivity; semiconductor device models; Gummel-Poon model; PISCES two-dimensional device simulation; bipolar transistor model; deionization; doping-dependent dielectric permittivity; impurity dopants; intrinsic carrier density; low-temperature circuit simulation; temperature-dependent free-carrier mobility; temperature-fitting parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location :
San Diego, CA, USA
Type :
conf
DOI :
10.1109/CICC.1989.56719
Filename :
5726186
Link To Document :
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