• DocumentCode
    2688120
  • Title

    The influence of heating temperature on alignment precision in thermosonic flip-chip bonding

  • Author

    Li-na Zhang ; Lei Han

  • Author_Institution
    Central South Univ., Changsha
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    According to the fact that heating will affect the image collection, target identification and track, so it will affect the alignment precision of the chips and substrates in the process of chips package. Sequence images were collected through the thermosonic flip-chip bonder under the different heating temperature, their parameters distribute regulation of translation, scale ,rotation under the influence of the temperature were respectively studied by phase correlation algorithm and 6-parameter affine model hierarchical search algorithm. The distributions of these parameters are highly random and nonlinear. To improve the algorithm speed, a hierarchical search algorithm based on the pyramid was adopted. By statistical analysis of the experimental results, it indicated that the higher the temperature, the higher the dispersion degree of translation, scale, rotation. So the temperature effects can not be ignored in thermosonic flip-chip bonding.
  • Keywords
    flip-chip devices; integrated circuit bonding; integrated circuit packaging; lead bonding; statistical analysis; thermal management (packaging); affine model hierarchical search algorithm; alignment precision; chips package; heating temperature influence; image collection; image sequence; phase correlation algorithm; target identification; thermosonic flip-chip bonding; Bonding; Brightness; Correlation; Electronic packaging thermal management; Heating; Manufacturing processes; Packaging machines; Statistical analysis; Target tracking; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4607102
  • Filename
    4607102