DocumentCode :
2688248
Title :
Research on solder joint intelligent optical inspection analysis
Author :
Ni, Li ; Kai-lin, Pan ; Peng, Li
Author_Institution :
Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin
fYear :
2008
fDate :
28-31 July 2008
Firstpage :
1
Lastpage :
4
Abstract :
The existing automatic optical inspection (AOI) equipment can be used to check out the defect of the electronic products, such as solder bridging, tomb stone and so on. Based on the existing AOI, a new intelligent optical inspection analysis (IOIA) technology is brought forward in this paper. The method, which combines off-line analysis and on-line contrast, is employed in the IOIA technology. That is to say, we should combine the conclusions of solder joint shape forecast and reliability analysis with on-line inspection technology of AOI smoothly. The basic principle of this method could be described as following: firstly, the structured light of monocular vision system must be improved to acquire the 3D information of practical solder joint shape. Then the relationships between solder joint shape and its reliability are introduced in this paper, and the 3D shape parameters which have significant effects to the solder joint reliability are extracted based on this relationship. Finally, contrasted the parameters of 3D shape with the data-base which established in off-line, and then the quality evaluation of solder joint could be given immediacy by using the data-base. According to the conclusions we can get the further quality evaluation and classification of the electronic products.
Keywords :
automatic optical inspection; computer vision; reliability; solders; 3D shape parameters; AOI equipment; automatic optical inspection equipment; intelligent optical inspection analysis; monocular vision system; online inspection technology; solder joint reliability analysis; solder joint shape forecast; Automatic optical inspection; Cameras; Information analysis; Light sources; Machine vision; Real time systems; Shape; Soldering; Spectroscopy; Surface-mount technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
Type :
conf
DOI :
10.1109/ICEPT.2008.4607109
Filename :
4607109
Link To Document :
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