DocumentCode
2688298
Title
Modelling and Measurement of Microstrip Transmission Line Structures
Author
Shepherd, P.R. ; Daly, P.
fYear
1985
fDate
4-6 June 1985
Firstpage
679
Lastpage
682
Abstract
New techniques have been employed in both the modelling and measurement of microstrip transmission line structures. The modelling employs a dual potential approach using finite element analysis to derive exact bounds to the microstrip characteristics. The measurement uses an "on-chip" calibration method with microstrip calibration pieces.
Keywords
Calibration; Capacitance; Dielectric constant; Finite element methods; Gallium arsenide; Impedance; Microstrip; Transmission line matrix methods; Transmission line measurements; Transmission line theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1985 IEEE MTT-S International
Conference_Location
St. Louis, MO, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1985.1132073
Filename
1132073
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