DocumentCode
2688332
Title
Message from the chairpersons
Author
Dyer, R.A. ; Schmalzel, J.L. ; Piuri, V.
Author_Institution
Kansas State Univ., Manhattan, KS, USA
fYear
2010
fDate
3-6 May 2010
Abstract
Welcome to the 2010 International Instrumentation and Measurement Technology Conference (I2MTC) and to Austin, Texas! We are thrilled to host this 27th annual gathering of engineers, scientists, business professionals and students to discuss and share what we know and are learning about the many essential fundamentals and broad applications of instrumentation and measurement. We hope that you will enjoy the educational sessions of the conference as well as the opportunity to make new acquaintances and expand your network of colleagues. This conference provides a wonderful venue for the exchange of information and the stimulation of new ideas and research initiatives. This year´s conference program will certainly continue that tradition.
Keywords
instrumentation; technical presentation; 2010 International Instrumentation and Measurement Technology Conference; conference program; message;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location
Austin, TX
ISSN
1091-5281
Print_ISBN
978-1-4244-2832-8
Type
conf
DOI
10.1109/IMTC.2010.5488149
Filename
5488149
Link To Document