• DocumentCode
    2688461
  • Title

    A novel built-in CMOS sensor for on-line thermal monitoring of VLSI circuits

  • Author

    Zhang Sheng ; Zhou Runde

  • Volume
    2
  • fYear
    2003
  • fDate
    21-24 Oct. 2003
  • Firstpage
    1345
  • Abstract
    Built-in temperature sensors increase the system reliability by predicting eventual faults caused by excessive chip temperatures. In this paper, a novel temperature sensor is presented, developed by the authors especially for the purpose of thermal monitoring of VLSI chips. This proposed sensor require very small silicon area and power consumption and the accuracy is in the order of 0.8°C.
  • Keywords
    CMOS integrated circuits; VLSI; integrated circuit reliability; integrated circuit testing; monitoring; temperature sensors; 0.8 C; VLSI circuits; built-in CMOS sensor; excessive chip temperatures; on-line thermal monitoring; power consumption; system reliability; temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2003. Proceedings. 5th International Conference on
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7889-X
  • Type

    conf

  • DOI
    10.1109/ICASIC.2003.1277466
  • Filename
    1277466
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2688461