• DocumentCode
    2688580
  • Title

    Non-contact strip speed measurement using electrostatic sensors

  • Author

    Yan, Yong ; Xie, Zizhuo ; Krabicka, Jan ; Shao, Jiaqing

  • Author_Institution
    Instrum., Control & Embedded Syst. Res. Group, Univ. of Kent, Canterbury, UK
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    1535
  • Lastpage
    1538
  • Abstract
    Accurate strip speed measurement is desirable in certain manufacturing industries. This paper presents the recent development in the non-contact measurement of strip speed using electrostatic sensors in conjunction with correlation signal processing techniques. A pair of narrow strip electrodes is used to derive signals from a moving solid surface. The speed of the solid surface is then determined from the known spacing between the electrodes and the time delay between the two signals. Experimental tests were conducted on a motorized cable speed test rig under a range of conditions. An optical tachometer was used as a reference instrument to assess the accuracy of the new strip speed measurement system. Basic sensor design considerations and the advantages and limitations of the method are addressed. Results demonstrate that the technique is capable of measuring strip speed with a relative error no greater than ±1.5% and a repeatability of better than 2%.
  • Keywords
    correlation methods; electric sensing devices; tachometers; velocity measurement; correlation signal processing technique; electrostatic sensor design; manufacturing industry; motorized cable speed test rig; narrow strip electrode; noncontact strip speed measurement; optical tachometer; solid surface; Delay effects; Electrodes; Electrostatic measurements; Manufacturing industries; Optical sensors; Signal processing; Solids; Strips; Testing; Velocity measurement; cross correlation; electrostatic sensor; non-contact measurement; strip speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488162
  • Filename
    5488162