• DocumentCode
    2688631
  • Title

    Measurement of residual stresses in encapsulant of a PQFP

  • Author

    Lee, Derek Chun Yu ; Kim, Jang-Kyo

  • Author_Institution
    Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, Hong Kong
  • fYear
    1998
  • fDate
    8-10 Dec 1998
  • Firstpage
    286
  • Lastpage
    290
  • Abstract
    This paper reports a preliminary result of residual stresses measured on a plastic quad flat pack (PQFP) using the hole drilling strain gauge (HDSG) method. The experimental results are compared with predictions made previously on an identical package based on finite element analysis (FEA). It was found that although there is a large variation in absolute values of residual stress between tests, all results show essentially the same trend: the residual principal stress decreases as the hole depth increases. This indicates that the stress concentration is the highest on the surface of the plastic encapsulant and decreases gradually toward the inside of package. A qualitatively similar trend is predicted from FEA study based on a model with a viscoelastic encapsulant. The experimental results exhibit a much larger variation across the thickness of the encapsulant than the FEA prediction. The FEA prediction based on the elastic model grossly overestimates the residual stresses by more than an order of magnitude compared to the experimental results
  • Keywords
    encapsulation; finite element analysis; integrated circuit measurement; integrated circuit packaging; internal stresses; machining; mechanical testing; plastic packaging; strain gauges; stress analysis; stress measurement; PQFP; elastic model; encapsulant; encapsulant thickness; finite element analysis; hole depth; hole drilling strain gauge method; plastic encapsulant; plastic encapsulant surface stress concentration; plastic quad flat pack; residual principal stress; residual stress; residual stress measurement; residual stress overestimation; residual stresses; stress concentration; viscoelastic encapsulant model; Drilling; Electronics packaging; Finite element methods; Plastic packaging; Predictive models; Residual stresses; Strain measurement; Stress measurement; Testing; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
  • Print_ISBN
    0-7803-5141-X
  • Type

    conf

  • DOI
    10.1109/EPTC.1998.756017
  • Filename
    756017