Title :
Measurement of residual stresses in encapsulant of a PQFP
Author :
Lee, Derek Chun Yu ; Kim, Jang-Kyo
Author_Institution :
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, Hong Kong
Abstract :
This paper reports a preliminary result of residual stresses measured on a plastic quad flat pack (PQFP) using the hole drilling strain gauge (HDSG) method. The experimental results are compared with predictions made previously on an identical package based on finite element analysis (FEA). It was found that although there is a large variation in absolute values of residual stress between tests, all results show essentially the same trend: the residual principal stress decreases as the hole depth increases. This indicates that the stress concentration is the highest on the surface of the plastic encapsulant and decreases gradually toward the inside of package. A qualitatively similar trend is predicted from FEA study based on a model with a viscoelastic encapsulant. The experimental results exhibit a much larger variation across the thickness of the encapsulant than the FEA prediction. The FEA prediction based on the elastic model grossly overestimates the residual stresses by more than an order of magnitude compared to the experimental results
Keywords :
encapsulation; finite element analysis; integrated circuit measurement; integrated circuit packaging; internal stresses; machining; mechanical testing; plastic packaging; strain gauges; stress analysis; stress measurement; PQFP; elastic model; encapsulant; encapsulant thickness; finite element analysis; hole depth; hole drilling strain gauge method; plastic encapsulant; plastic encapsulant surface stress concentration; plastic quad flat pack; residual principal stress; residual stress; residual stress measurement; residual stress overestimation; residual stresses; stress concentration; viscoelastic encapsulant model; Drilling; Electronics packaging; Finite element methods; Plastic packaging; Predictive models; Residual stresses; Strain measurement; Stress measurement; Testing; Viscosity;
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
DOI :
10.1109/EPTC.1998.756017