Title :
High-speed A/D-D/A Conversion System with flexible testing capabilities
Author :
Vital, João C. ; Franca, José E.
Author_Institution :
Integrated Circuits and Systems Group
Keywords :
Analog-digital conversion; Built-in self-test; CMOS technology; Circuit simulation; Circuit testing; Computer architecture; Design for testability; Integrated circuit testing; Recycling; System testing;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669710
