Abstract :
Reliability performance and cost reduction are the two main issues at present in the semiconductor back end assembly industry. A major step in cost reduction could be the dambar-less molding process, which reduces the trimming and forming costs. Together with Ni-Pd plated lead frames, which eliminates the pretinning process, significant cost reduction could be achieved, but current molding technology does not allow flash and bleed-free dambar-less molding. In addition, the existing molding compounds suffer from a fatal drawback: limited reliability performance due to poor popcorn resistance, mostly induced by insufficient adhesion of the encapsulant to the Ni-Pd plated lead frame. Indeed, no high pin count devices using the Ni-Pd plating technology are available on the market. The use of Pre-Packed Processing (3PR) technology and processes together with a recently developed high performance compound without mold-release agents but using special adhesion promoters has virtually eliminated these problems and successfully achieved dambar-less molded devices with JEDEC-level 1 popcorn resistance on Ni-Pd plated lead frames. These results are presented and discussed with emphasis on 3PR technology and the newly developed molding compound
Keywords :
adhesion; assembling; encapsulation; integrated circuit packaging; integrated circuit testing; moulding; nickel; palladium; thermal stress cracking; 3P technology; JEDEC-level 1 popcorn resistance; Ni-Pd; Ni-Pd plated dambar less lead frames; Ni-Pd plated lead frame; Ni-Pd plated lead frames; Ni-Pd plating technology; Ni/Pd plated lead frames; Pre-Packed Processing technology; QFP160 package; adhesion promoters; bleed-free dambar-less molding; cost reduction; dambar-less molded devices; dambar-less molding process; encapsulant adhesion; forming; mold-release agents; molding compounds; molding technology; pin count; popcorn performance; popcorn resistance; pretinning process elimination; reliability; reliability performance; semiconductor back end assembly; trimming; Adhesives; Assembly; Cleaning; Costs; Information analysis; Lead; Semiconductor device reliability; Shape; Viscosity; Wire;