DocumentCode :
2688790
Title :
Strain-rate and impact velocity effects on joint adhesion strength
Author :
Yeh, Chang-Lin ; Lai, Yi-Shao
Author_Institution :
Shanghai Labs., ASE Assembly & Test (Shanghai) Ltd., Shanghai
fYear :
2008
fDate :
28-31 July 2008
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, numerical studies are carried out on high-speed cold ball pull test by using explicit transient finite element simulations to predict transient response of package-level solder ball subjected to pull loads. The material constitutions of solder alloys are obtained from quasi-static tensile test and Hopkinsonpsilas bar test. Erosion technique is adopted for simulations of bulk solder fracturing, and interfacial element for intermetalic compound (IMC) fracturing. Parameter studies on pull velocity effect as well as strain-rate effect are also carried out. Transition points of pull velocity between bulk solder fracturing mode and IMC fracturing mode are identified therefore. From simulation results, transform relationship between pull forces to joint adhesion strengths of solder joints can be set up.
Keywords :
adhesion; alloys; electronics packaging; finite element analysis; fracture; impact testing; interface phenomena; mechanical strength; solders; tensile testing; Hopkinsonpsilas bar test; bulk solder fracture simulations; erosion technique; explicit transient finite element simulations; high-speed cold ball pull test; impact velocity effects; interfacial element; intermetalic compound fracture; joint adhesion strength; package-level solder ball; pull loads conditions; quasistatic tensile test; solder alloys; strain-rate effects; transient response prediction; Adhesives; Assembly; Electronics packaging; Finite element methods; Materials testing; Predictive models; Semiconductor device testing; Soldering; System testing; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
Type :
conf
DOI :
10.1109/ICEPT.2008.4607139
Filename :
4607139
Link To Document :
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