DocumentCode :
2688795
Title :
Underfill material requirements for reliable flip chip assemblies
Author :
Tay, H.L. ; Cui, C.Q.
Author_Institution :
Inst. of Microelectron., Singapore
fYear :
1998
fDate :
8-10 Dec 1998
Firstpage :
345
Lastpage :
348
Abstract :
Underfill encapsulation has been demonstrated to be necessary to improve the temperature cycle performance of solder joint interconnections and enhance the reliability of flip chip assemblies. An in-depth understanding of underfill materials is a challenge for packaging engineers to develop underfill materials with functional requirements for applications in IC packaging. This paper investigates the material physical properties observed in a bisphenol/amine underfill system using imidazole as the catalyst and silica as the filler. Typical underfill formulations, comprising epoxy resins, hardeners, silica fillers and catalyst were considered. The impact of the material properties on the reliability of flip chip assemblies was discussed. Test vehicles using 16×7 mm silicon flip chips assembled and encapsulated with different underfill materials on daisy chain PCBs were subjected to a temperature cycling test at -40°C air/20 min to 125°C air/20 min. It was found that underfills with high adhesion strength, low CTE and high modulus exhibited high reliability in temperature cycling tests
Keywords :
catalysts; encapsulation; filled polymers; flip-chip devices; hardening; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; particle reinforced composites; thermal stresses; -40 to 125 C; 16 mm; 7 mm; CTE; IC packaging; Si; SiO2; adhesion strength; bisphenol/amine underfill system; daisy chain PCBs; epoxy resins; flip chip assemblies; functional requirements; hardeners; imidazole catalyst; material physical properties; modulus; reliability; reliable flip chip assemblies; silica filler; silicon flip chips; solder joint interconnections; temperature cycle performance; temperature cycling test; test vehicles; underfill encapsulation; underfill formulation; underfill material requirements; underfill materials; Assembly; Encapsulation; Flip chip; Integrated circuit packaging; Materials reliability; Materials testing; Reliability engineering; Silicon compounds; Soldering; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
Type :
conf
DOI :
10.1109/EPTC.1998.756027
Filename :
756027
Link To Document :
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