Title :
Adhesion between moulding compound and substrate
Author :
Bogner, M. ; Holzapfel, W. ; Maier, M. ; Quella, F. ; Schwarz, R.
Author_Institution :
Siemens, Munchen, Germany
Abstract :
A theory taken from composite materials is applied to determine the adhesion between molding compound and chip by means of nondestructive dynamic-mechanical experiments. A test rod with an incorporated metal strip (Cu, Si, etc.) can be used to determine adhesion strength as a characteristic quality feature. The advantage compared with destructive test methods is that the same rod can be used for temperature-dependent measurements and can be reused after different storage cycles. The results indicate a worse adhesion between the low-stress molding compounds and copper or silicon in comparison with standard materials.<>
Keywords :
adhesion; copper; encapsulation; materials testing; silicon; adhesion between molding compound; adhesion strength; characteristic quality feature; chip; low-stress molding compounds; nondestructive dynamic-mechanical experiments; reusable test rod; temperature-dependent measurements; Adhesives; Composite materials; Copper; Delamination; Polymers; Silicon; Testing; Thermal expansion; Thermal stresses; Very large scale integration;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1990, IEMT Conference., 8th IEEE/CHMT International
Conference_Location :
Baveno, Italy
DOI :
10.1109/IEMT8.1990.171055