• DocumentCode
    2688830
  • Title

    Adhesion between moulding compound and substrate

  • Author

    Bogner, M. ; Holzapfel, W. ; Maier, M. ; Quella, F. ; Schwarz, R.

  • Author_Institution
    Siemens, Munchen, Germany
  • fYear
    1990
  • fDate
    0-0 1990
  • Firstpage
    332
  • Lastpage
    339
  • Abstract
    A theory taken from composite materials is applied to determine the adhesion between molding compound and chip by means of nondestructive dynamic-mechanical experiments. A test rod with an incorporated metal strip (Cu, Si, etc.) can be used to determine adhesion strength as a characteristic quality feature. The advantage compared with destructive test methods is that the same rod can be used for temperature-dependent measurements and can be reused after different storage cycles. The results indicate a worse adhesion between the low-stress molding compounds and copper or silicon in comparison with standard materials.<>
  • Keywords
    adhesion; copper; encapsulation; materials testing; silicon; adhesion between molding compound; adhesion strength; characteristic quality feature; chip; low-stress molding compounds; nondestructive dynamic-mechanical experiments; reusable test rod; temperature-dependent measurements; Adhesives; Composite materials; Copper; Delamination; Polymers; Silicon; Testing; Thermal expansion; Thermal stresses; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1990, IEMT Conference., 8th IEEE/CHMT International
  • Conference_Location
    Baveno, Italy
  • Type

    conf

  • DOI
    10.1109/IEMT8.1990.171055
  • Filename
    171055