Title :
Design Of A Testable Risc-to-cisc Control Architecture
Author :
Malaiya, Yashwant K. ; Sheng Feng
Author_Institution :
Colorado State University
fDate :
Nov. 30 1988-Dec. 2 1988
Keywords :
Circuit testing; Computer architecture; Computer science; Control systems; Costs; Electrical capacitance tomography; Instruction sets; Logic testing; Production; Reduced instruction set computing;
Conference_Titel :
Microprogramming and Microarchitecture, 1988., Proceeding of the 21st Annual Workshop on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-8186-1919-8
DOI :
10.1109/MICRO.1988.639254
