DocumentCode :
2689143
Title :
On some symmetry based validity indices
Author :
Saha, Sriparna ; Bandyopadhyay, Sanghamitra
Author_Institution :
Indian Stat. Inst., Kolkata
fYear :
2007
fDate :
25-28 Sept. 2007
Firstpage :
697
Lastpage :
704
Abstract :
Identification of the correct number of clusters and the corresponding partitioning are two important considerations in clustering. In this paper, a newly developed point symmetry based distance is used to propose symmetry based versions of six cluster validity indices namely, DB-index, Dunn-index, generalized Dunn-index, PS-index, I-index and XB-index. These indices provide measures of "symmetricity" of the different partitionings of a data set. A Kd-tree-based data structure is used to reduce the complexity of computing the symmetry distance. A newly developed genetic point symmetry based clustering technique, GAPS-clustering is used as the underlying partitioning algorithm. The number of clusters are varied from 2 to radicn where n is the total number of data points present in the data set and the values of all the validity indices are noted down. The optimum value of a validity index over these radicn-1 partitions corresponds to the appropriate partitioning and the number of partitions as indicated by the validity index. Results on five artificially generated and four real-life data sets show that symmetry distance based I-index performs the best compared to all the other five indices.
Keywords :
computational complexity; genetic algorithms; pattern clustering; tree data structures; DB-index; Dunn-index; I-index; Kd-tree-based data structure; PS-index; XB-index; computational complexity; data partitioning algorithm; generalized Dunn-index; genetic algorithm; point symmetry based cluster validity index; Clustering algorithms; Clustering methods; Data structures; Euclidean distance; Genetic algorithms; Machine intelligence; Particle measurements; Partitioning algorithms; Shape; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Evolutionary Computation, 2007. CEC 2007. IEEE Congress on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1339-3
Electronic_ISBN :
978-1-4244-1340-9
Type :
conf
DOI :
10.1109/CEC.2007.4424539
Filename :
4424539
Link To Document :
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