DocumentCode
2689254
Title
Heart rate reliability for the Smart Rollator
Author
Gang, Ji ; Chan, Adrian D C ; Cuhadar, Aysegul
Author_Institution
Dept. of Syst. & Comput. Eng., Carleton Univ., Ottawa, ON, Canada
fYear
2010
fDate
3-6 May 2010
Firstpage
1044
Lastpage
1047
Abstract
In this paper, we propose an algorithm to quantify the reliability of heart rates estimated from electrocardiogram (ECG) data. Long-term ECG monitoring is becoming more prevalent with an increasing number of ambulatory monitors, including the Smart Rollator which is a rollator equipped with a series of minimally obtrusive sensors. The ECG reliability index enables the automatic pre-processing of data, to highlight or discard data that are corrupted by noise or other artifacts. Three reliability indices are proposed that are based on the assumption of a short-term invariant PQRST waveform. These indices use distance measures to quantify the reliability of the ECG, which are: 1) percent residual difference, 2) cross-correlation coefficient, and 3) a wavelet distance measure. The reliability indices are evaluated using real ECG data corrupted with three types of noise: 1) baseline wander, 2) electromyogram artifacts, and 3) motion artifact. All three reliability indices demonstrate an ability to track the accuracy of heart rate estimates derived from the ECG. Among the three indices investigated in this work, the wavelet distance measure provides the best performance.
Keywords
cardiology; electrocardiography; wavelet transforms; ECG monitoring; ambulatory monitors; cross-correlation coefficient; electrocardiogram; heart rate reliability; residual difference; short-term invariant PQRST waveform; smart rollator; wavelet distance measure; Aging; Data engineering; Databases; Electrocardiography; Heart rate; Intelligent sensors; Medical services; Motion estimation; Remote monitoring; Stability; ambulatory monitoring; electrocardiogram; reliability index; remote monitoring; rollator;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location
Austin, TX
ISSN
1091-5281
Print_ISBN
978-1-4244-2832-8
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2010.5488205
Filename
5488205
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