DocumentCode :
2689392
Title :
An improved capacitance measurement technique based of RC phase delay
Author :
Dean, Robert N. ; Rane, Aditi
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
fYear :
2010
fDate :
3-6 May 2010
Firstpage :
367
Lastpage :
370
Abstract :
Capacitance can be measured by utilizing the phase delay through an RC network consisting of the unknown capacitance and a resistor. Specifically, the RC network delays the state change of an input square wave to produce a pulse width modulated signal based on the phase delay through the RC network. The response of this implementation, however, becomes severely nonlinear if the phase delay is greater than approximately 45°. An improved implementation is presented that avoids the nonlinearity by using a MOSFET switch to discharge the unknown capacitor during each measurement cycle. A prototype circuit was implemented and tested with a 0.7-20pF variable capacitor and a linear response was measured with a sensitivity of 246mV/pF when the output pulse width modulated signal was lowpass filtered, level shifted and amplified.
Keywords :
RC circuits; capacitance measurement; capacitors; field effect transistor switches; pulse width modulation; resistors; MOSFET switch; RC network delays; RC phase delay; capacitance measurement technique; capacitors; linear response; lowpass filter; pulse width modulated signal; Capacitance measurement; Circuit testing; Phase measurement; Phase modulation; Propagation delay; Pulse measurements; Pulse width modulation; Resistors; Space vector pulse width modulation; Switches; CMOS interface circuit; capacitance measurement; pulse width modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
ISSN :
1091-5281
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2010.5488213
Filename :
5488213
Link To Document :
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