Title :
Statistical sensitivity analysis of MOSFET integrated circuits using process database
Author :
Wong, Waisum ; Winton, Raymond S. ; Liou, Juin J.
Abstract :
A systematic approach is presented for analyzing MOSFET integrated circuit performance as functions of MOSFET channel-length and channel-width variations. The methodology, which involves an algorithm based on Tellegen´s theorem and a database that contains the statistical information of MOSFET process parameters, is implemented in SPICE2 circuit simulator. Sensitivity simulation of a MOSFET operational amplifier is included to illustrate the usefulness of the method
Keywords :
MOS integrated circuits; circuit analysis computing; sensitivity analysis; statistical analysis; MOSFET integrated circuits; MOSFET process parameters; SPICE2 circuit simulator; Tellegen´s theorem; channel-length; channel-width variations; circuit performance; computer aided analysis; operational amplifier; process database; statistical information; statistical sensitivity analysis;
Conference_Titel :
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/CICC.1989.56805
