Title :
Boundary scan and its application to analog-digital ASIC testing in a board/system environment
Author :
Fasang, Patrick P.
Abstract :
The author introduces the concept and motivations for developing boundary scan (BS) and explains the input BS cell, the output BS cell, and the bidirectional BS cell. He then describes the application of boundary scan to the testing of analog-digital application-specific integrated circuits (ASICs) in a board/system environment. An example is given to illustrate the concept and the application
Keywords :
application specific integrated circuits; digital integrated circuits; integrated circuit testing; linear integrated circuits; printed circuit testing; IC testing; PCB mounted devices; analog-digital ASIC testing; application-specific integrated circuits; bidirectional BS cell; board/system environment; boundary scan; input BS cell; output BS cell;
Conference_Titel :
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/CICC.1989.56810
