DocumentCode
2689530
Title
Boundary scan and its application to analog-digital ASIC testing in a board/system environment
Author
Fasang, Patrick P.
fYear
1989
fDate
15-18 May 1989
Abstract
The author introduces the concept and motivations for developing boundary scan (BS) and explains the input BS cell, the output BS cell, and the bidirectional BS cell. He then describes the application of boundary scan to the testing of analog-digital application-specific integrated circuits (ASICs) in a board/system environment. An example is given to illustrate the concept and the application
Keywords
application specific integrated circuits; digital integrated circuits; integrated circuit testing; linear integrated circuits; printed circuit testing; IC testing; PCB mounted devices; analog-digital ASIC testing; application-specific integrated circuits; bidirectional BS cell; board/system environment; boundary scan; input BS cell; output BS cell;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location
San Diego, CA, USA
Type
conf
DOI
10.1109/CICC.1989.56810
Filename
5726277
Link To Document