Title :
Built-in self-repair circuit for high-density ASMIC
Author :
Sawada, Kazuhiro ; Sakurai, Takayasu ; Uchino, Yukinori ; Yamada, Kaoruko
Abstract :
A built-in self-repair (BISR) circuit is introduced to achieve high yield and to overcome the testing problem for high-density application-specific memory ICs (ASMIC). The feasibility of BISR is demonstrated for a 1-Mb DRAM embedded gate array. A die-sort strategy using BISR is also discussed
Keywords :
application specific integrated circuits; automatic testing; integrated memory circuits; random-access storage; 1 Mbit; ASIC; BISR; DRAM embedded gate array; application-specific memory ICs; built-in self-repair; die-sort strategy; dynamic RAM; high-density ASMIC; self-testing;
Conference_Titel :
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/CICC.1989.56835
