Title :
Pulse-width degradation in digital circuits
Author :
Tomczak, James ; Brooks, Thomas ; Melrose, Caryn Gallo
Abstract :
Pulsewidth distortion is a major contributing factor in limiting circuit performance. For 1-μm technology, inverting circuits had a 238-MHz data rate limit, 2.5× that of noninverting circuits. Process parameter tracking of 20% leads to pulsewidth distortion of ±100 ps for reasonable circuit loading. Loading and process tolerance variation were simulated with end-point statistical analysis, reducing computer time 10× over standard statistical methods
Keywords :
digital integrated circuits; electric distortion; statistical analysis; 1 micron; 238 MHz; circuit performance; digital circuits; end-point statistical analysis; inverting circuits; loading simulation; noninverting circuits; process parameter tracking; process tolerance variation; pulse width degradation; pulsewidth distortion;
Conference_Titel :
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/CICC.1989.56840
