• DocumentCode
    2690136
  • Title

    Illumination invariant measurement of mechanical dimensions using a multiple segmentation method

  • Author

    Ohliger, Kevin ; Edeler, Torsten ; Hussmann, Stephan ; Mertins, Alfred

  • Author_Institution
    Dept. of Electr. Eng. & Inf. Technol., Westcoast Univ. of Appl. Sci., Heide, Germany
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    1008
  • Lastpage
    1013
  • Abstract
    In many industrial processes the need for better quality assurance leads to a higher degree of process automation which often includes an optical inspection system. In our case the mechanical dimensions of printed micro structures on ceramic substrates have to be evaluated. Therefore an optical inspection system providing high resolution images with 12288 pixel × 14000 pixel was developed. The segmentation task in this setup is challenging caused by the huge amount of data and the different appearances of the micro structures depending on size, material, and humidity. For this purpose we present a multiple segmentation method and evaluate the results against common used segmentation methods on a number of different real images. Experimental results show that the proposed optical inspection system and algorithms can achieve an illumination invariant high resolution measurement of the micro structures.
  • Keywords
    image segmentation; optical resolving power; high resolution images; illumination invariant measurement; mechanical dimensions; multiple segmentation method; optical inspection system; printed micro structures; process automation; Automatic optical inspection; Automation; Ceramics; Image resolution; Image segmentation; Lighting; Mechanical variables measurement; Optical materials; Pixel; Quality assurance; AMSER; MSER; ROI; adapted maximally stable extremal regions; high resolution; illumination invariant; maximally stable extremal regions; optical inspection system; region of interest; segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488256
  • Filename
    5488256