Title :
Large-Signal Narrow Band Quasi-Black-Box Modelling of Microwave Transistors
Author :
Filicori, F. ; Mambrioni, A. ; Monaco, V.A.
Abstract :
A method is proposed for the large-signal narrow-band characterization of microwave active devices. It does not require a detailed knowledge of the device internal structure, but only some measurements of small signal S parameters effected under different bias conditions and some other simple large-signal measurements to be effected by a standard network analyzer.
Keywords :
Delay; Equations; Frequency measurement; Mathematical model; Microwave devices; Microwave measurements; Microwave transistors; Narrowband; Packaging; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 1986 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
DOI :
10.1109/MWSYM.1986.1132201
