• DocumentCode
    2690314
  • Title

    Advances in Low-Cost Component Manufacturing: Avantek´s Die Manufacturing Facility in Newark, California

  • Author

    Crowley, K.

  • fYear
    1986
  • fDate
    2-4 June 1986
  • Firstpage
    433
  • Lastpage
    435
  • Abstract
    The microwave semiconductor industry is changing. Unit demand is rising and pressure to reduce price per function follows. If the industry is to meet these challenges, it must evolve rapidly. Analysis of the digital silicon industry may provide clues as to how to proceed.
  • Keywords
    Circuit testing; Costs; Electrostatic discharge; Fabrication; Manufacturing industries; Materials testing; Microwave circuits; Packaging; Production facilities; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1986 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1986.1132213
  • Filename
    1132213