• DocumentCode
    2690917
  • Title

    Improving interacting residue prediction using long-distance information in hidden Markov models

  • Author

    Kern, Colin ; González, Alvaro J. ; Liao, Li ; Vijay-Shanker, K.

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Univ. of Delaware, Newark, DE, USA
  • fYear
    2012
  • fDate
    4-7 Oct. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Identification of interacting residues involved in protein-protein and protein-ligand interaction is critical for the prediction and understanding of the interaction and has practical impact on mutagenesis and drug design. In this work, we introduce a new decoding algorithm, ETB-Viterbi, with early trace back mechanism built into interaction profile hidden Markov models (ipHMMs) that can incorporate the long-distance correlations between interacting residues to improve prediction accuracy. The method was applied and tested to a set of domain-domain interaction families from the 3DID database, and showed statistically significant improvement in accuracy measured by F-score. To gauge and assess the method´s effectiveness in capturing the correlation signals, sets of simulated data based on the 3DID dataset with controllable correlation between interacting residues were also used, and it was demonstrated that the prediction consistently improves as the correlations increase.
  • Keywords
    bioinformatics; hidden Markov models; molecular biophysics; proteins; statistical analysis; ETB-Viterbi decoding algorithm; F-score; drug design; early trace back mechanism; interacting residue identification; interacting residue prediction; interaction profile hidden Markov models; ipHMM; long distance correlations; long distance information; mutagenesis; protein-ligand interaction; protein-protein interaction; Accuracy; Amino acids; Correlation; Decoding; Hidden Markov models; Proteins; Viterbi algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedicine (BIBM), 2012 IEEE International Conference on
  • Conference_Location
    Philadelphia, PA
  • Print_ISBN
    978-1-4673-2559-2
  • Electronic_ISBN
    978-1-4673-2558-5
  • Type

    conf

  • DOI
    10.1109/BIBM.2012.6392666
  • Filename
    6392666