Title :
Integrated Fin-Line 6-Ports for MM-Wave Network Analyzers
Author :
Malkomes, M. ; Walsdorf, R.
Abstract :
The design and performance of an integrated 6-port mm-wave reflectometer is presented. The design uses Fin-Line technology and beam lead diode detectors in a Ka- full-band application. The high precision measurement capability of the 6-port device has been tested successfully in an automated 6-port network analyzer setup.
Keywords :
Calibration; Coupling circuits; Detectors; Finline; Frequency; Optical coupling; Optical reflection; Power measurement; Schottky diodes; Velocity measurement;
Conference_Titel :
Microwave Symposium Digest, 1986 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
DOI :
10.1109/MWSYM.1986.1132277
