Experimental characterization of SET seasoning on Phase Change Memory arrays

Author

Zambelli, Cristian ; Chimenton, Andrea ; Olivo, Piero

Author_Institution

Dipt. di Ing., Univ. degli Studi di Ferrara, Ferrara, Italy

fYear

2010

fDate

16-19 May 2010

Firstpage

1

Lastpage

4

Abstract

In this work we have investigated the seasoning effect in SET state occurring during cycling of multimegabit Phase Change Memory arrays. The impact of the erasing waveform on this phenomenon has been experimentally evaluated. The physical nature of the phenomenon has been discussed in relation to the electro-thermal characteristics of the active material. The study of such phenomenon is also important to comprehend the transition dynamics of the GST material towards its crystalline state and to develop accurate models allowing an estimate of the PCM cells behavior as a function of the operative cycles.

Keywords

phase change memories; single electron transistors; GST material; PCM cells behavior; SET seasoning; active material; crystalline state; electro-thermal characteristics; erasing waveform; operative cycles; phase change memory arrays; Amorphous materials; Crystalline materials; Crystallization; Current measurement; Phase change materials; Phase change memory; Phased arrays; Shape control; Voltage; Writing;

fLanguage

English

Publisher

ieee

Conference_Titel

Memory Workshop (IMW), 2010 IEEE International

Conference_Location

Seoul

Print_ISBN

978-1-4244-6719-8

Electronic_ISBN

978-1-4244-7668-8

Type

conf

DOI

10.1109/IMW.2010.5488326

Filename

5488326