Title :
Labor contraction prediction via demographic and obstetrical information analysis
Author :
Huang, Zifang ; Shyu, Mei-Ling ; Tien, James M. ; Birnbach, David J. ; Vigoda, Michael M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Miami, Coral Gables, FL, USA
Abstract :
Designing an optimal dosing regimen for the systemic opioid remifentanil during labor necessitates the prediction of the pace of contractions, so that the drug can be given shortly before the pain of the contraction begins. The prediction and drug administration should be made early enough to allow for the administration of intravenous analgesia that will have maximal efficacy during contractions and little effect between contractions. Towards such a need, we propose a knowledge-assisted sequential pattern analysis framework to predict the changes in intrauterine pressure, which indicate the occurrence of labor contractions. In particular, a patient selection strategy is proposed to select a group of patients, from the stored record, who share similar demographic and obstetrical information with the current patient of interest. A sequential association rule mining approach is designed to learn the patterns of the contractions from the historical patient tracings, and to determine which demographic and obstetrical features have an impact on the contraction patterns. The promising experimental results show that the proposed framework is effective, robust, and efficient in predicting the labor contraction patterns.
Keywords :
bioinformatics; drugs; contraction pace; demographic information analysis; intrauterine pressure; intravenous analgesia; labor contraction prediction; obstetrical information analysis; optimal dosing regimen; patient selection strategy; systemic opioid remifentanil; Anesthesia; Association rules; Itemsets; Pain; Predictive models; Time series analysis; Training; association rule mining; labor contraction prediction; pattern analysis; predictive models;
Conference_Titel :
Bioinformatics and Biomedicine (BIBM), 2012 IEEE International Conference on
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4673-2559-2
Electronic_ISBN :
978-1-4673-2558-5
DOI :
10.1109/BIBM.2012.6392687