Title :
Real-time 3D visualization of Deep sea In-situ Soil Tester
Author :
Dineshkumar, D. ; Chandran, V. ; Muthuswamy, V. ; Jayanthi, K. ; Muthuvel, P. ; Varshney, Nidhi ; Ramadass, G.A. ; Atmanand, M.A.
Author_Institution :
Nat. Inst. of Ocean Technol., Chennai, India
Abstract :
In this paper, 3D modeling of In-situ soil tester is discussed particularly enhancing the features of cone, vane and Vibration Sinkage Test Assembly (VSTA) operations. Initially 3D models are created and shared by OpenGL (Open Graphics Library) and VRML (Virtual Reality Modeling Language), then the virtual scene is displayed on 3D picture display by importing the same into LabVIEW by 3D graphics toolbox, which can be controlled as required. The 3D virtual model of Soil tester is driven by the real time data and the results reflect the motion of the In-situ soil tester underwater. The main work is focused on the 3D software modeling, instead of complicated programming; it greatly reduces the difficulty of the virtual scene modeling and shortens the development cycle of the interactive simulation system. At the same time, the system based on these methods is easy to maintain and transplant. It will find wide applications in the fields such as military, entertainment, medical and robotics.
Keywords :
computer graphics; electronic engineering computing; oceanographic equipment; virtual instrumentation; virtual reality languages; 3D Deep sea in-situ soil tester visualization; 3D graphics toolbox; 3D picture display; 3D soil tester virtual model; LabVIEW; OpenGL; VRML; VSTA operation; entertainment; in-situ soil tester underwater motion; interactive simulation system; medical; military; open graphics library; robotics; vibration sinkage test assembly; virtual reality modeling language; virtual scene modeling; Blades; Data visualization; Instruments; Process control; Switches; Three-dimensional displays; 3D Visualization; LabVIEW 3D Picture control toolkit; Real-time Data Acquisition; Virtual Scene 3D Modeling;
Conference_Titel :
Underwater Technology (UT), 2015 IEEE
Conference_Location :
Chennai
Print_ISBN :
978-1-4799-8299-8
DOI :
10.1109/UT.2015.7108272