DocumentCode :
2691588
Title :
High Performance Monolithic Power Amplifier Using a Unique Ion Implantation Process
Author :
Wang, S.K. ; Wang, K.G. ; Chang, C.D.
fYear :
1986
fDate :
2-4 June 1986
Firstpage :
803
Lastpage :
805
Abstract :
State-of-the-art X-band power FETs and monolithic amplifiers have been fabricated by a high yield planar process using a unique double-peaked implant profile. A 1-mm FET has achieved 40 percent power added efficiency with 720 mW output power and 6.3 dB gain at 10 GHz. A two-stage monolithic amplifier has delivered 2.2 W output power at 9.5 GHz for a record 0.6 W/mm power density. The monolithic amplifier chips have also achieved 20 percent dc-yield and 5 percent uniformity in I/sub DSS/ and V/sub PO/.
Keywords :
Doping profiles; FETs; Fabrication; Gallium arsenide; High power amplifiers; Implants; Ion implantation; Power amplifiers; Power generation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1986 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1986.1132313
Filename :
1132313
Link To Document :
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