DocumentCode
2691655
Title
Efficient computation of the azimuth and elevation angles of the sources by using unitary matrix pencil method (2-D UMP)
Author
Yilmazer, N. ; Sarkar, T.K.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., NY
fYear
2006
fDate
9-14 July 2006
Firstpage
1145
Lastpage
1148
Abstract
In this study, we extended the 1-dimensional (1-D) unitary matrix pencil method to 2-dimensional case, where 2-D matrix pencil method are used to find the 2-D poles corresponding to the direction of arrival, azimuth and elevation angles, of the far field sources impinging on antenna arrays. This technique uses matrix pencil (MP) method to compute the direction of arrival (DOA) of the signals using a very efficient computational procedure in which the complexity of the computation can be reduced significantly by using a unitary matrix transformation. This method applies the technique directly to the data without forming a covariance matrix. Using real computations through the unitary transformation for the 2-D matrix pencil method leads to a very efficient computational methodology for real time implementation on a DSP chip. The numerical simulation results are provided to see the performance of the method. The simulation results show that for the low signal to noise ratio (SNR) cases the new 2-D unitary matrix pencil method outperforms the current 2-D MP method
Keywords
antenna arrays; computational complexity; direction-of-arrival estimation; matrix algebra; 1D unitary matrix pencil method; 2D matrix pencil method; DOA; DSP chip; SNR; antenna arrays; azimuth; digital signal processing; direction of arrival; elevation angles; signal to noise ratio; unitary matrix transformation; Azimuth; Computational complexity; Covariance matrix; Karhunen-Loeve transforms; Matrix converters; Signal processing; Signal to noise ratio; Sparse matrices; Symmetric matrices; Two dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
1-4244-0123-2
Type
conf
DOI
10.1109/APS.2006.1710739
Filename
1710739
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