Title :
Polarization-induced zener tunnel junctions in wide-bandgap heterostructures
Author :
Simon, John ; Zhang, Ze ; Goodman, Kevin ; Kosel, Thomas ; Fay, Patrick ; Jena, Debdeep
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Abstract :
The wide bandgap semiconductors such as the lll-V nitrides (GaN, AIN) and SiC, tunneling is low due to the high barrier heights, and is hampered further by the inability to achieve degenerate n and p-type impurity doping. By utilizing the giant built-in electronic polarization fields present in wurzite lll-V nitride semiconductor heterostructures, it is possible to achieve interband tunneling in p-n junction diodes. GaN-AIN-GaN heterostructures were grown by plasma assisted Molecular Beam Epitaxy (MBE) on n-type doped GaN 0001 substrates. The layer structure, and a Transmission Electron Microscope (TEM) image of the GaN/AIN/GaN tunnel junction which was used to confirm the thickness and uniformity of the AIN layer. Current-voltage characteristics of the junctions were measured at 300 K in a probe station using a semiconductor parameter analyzer. By utilizing the polarization fields present in lll-V nitride semiconductors it is possible to generate band to band tunneling. This will enable multicolor light emitters/detectors and multijunction solar cells, as well as enable efficient injection of polarized carriers for spintronic devices.
Keywords :
III-V semiconductors; Zener effect; aluminium compounds; doping; gallium compounds; light emitting diodes; molecular beam epitaxial growth; p-n heterojunctions; silicon compounds; solar cells; transmission electron microscopy; tunnelling; wide band gap semiconductors; GaN; GaN-AlN-GaN; MBE; SiC; TEM; current-voltage characteristics; electronic polarization fields; multicolor light emitters-detectors; multijunction solar cells; p-n junction diodes; p-type impurity doping; plasma assisted molecular beam epitaxy; polarization-induced zener tunnel junctions; spintronic devices; temperature 300 K; transmission electron microscopy; tunneling; wide-bandgap semiconductor heterostructures; wurzite lll-V nitride semiconductor heterostructures; Gallium nitride; Molecular beam epitaxial growth; Optical polarization; P-n junctions; Plasma measurements; Semiconductor device doping; Semiconductor impurities; Silicon carbide; Tunneling; Wide band gap semiconductors;
Conference_Titel :
Device Research Conference, 2009. DRC 2009
Conference_Location :
University Park, PA
Print_ISBN :
978-1-4244-3528-9
Electronic_ISBN :
978-1-4244-3527-2
DOI :
10.1109/DRC.2009.5354860