Title :
Reliability And Degradation Behavior Of A InGaAsP/InP Waveguide Photodiode For Subscriber Systems
Author :
Mawatari, H. ; Fukuda, Motohisa ; Kate, Kiran ; Kozen, A. ; Yuda, M. ; Takeshita, Takaharu ; Uchida, Noriki ; Toba, H.
Author_Institution :
NTT Opto-Electronics Laboratory
Keywords :
Absorption; Aging; Dark current; Degradation; Electron optics; Indium phosphide; Optical sensors; Photodiodes; Plasma temperature; Testing;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-3889-8
DOI :
10.1109/CLEOPR.1997.610630
