Title :
Wide Bandwidth Measurement of Permittivity using Multi-Resonant Modes
Author :
Zhang, Z. ; Vulin, L. ; Pan, G.
Author_Institution :
Arizona State Univ., Tempe, AZ
Abstract :
In this paper, a new dielectric measurement technique has been developed. A circular parallel plate capacitor structure was used in investigating the complex permittivity of a thin film. The full-wave analysis has been done and a simple and explicit relationship between the complex permittivity and the modal impedance has been obtained at the resonant frequencies. To investigate our measurement technique, the high order mode calculation was carried out and good results near the modal resonant frequencies was achieved
Keywords :
capacitors; dielectric materials; dielectric thin films; permittivity measurement; circular parallel plate capacitor structure; dielectric measurement technique; full-wave analysis; modal impedance; multi-resonant modes; resonant frequencies; thin film; wide bandwidth permittivity measurement; Bandwidth; Capacitors; Dielectric materials; Dielectric measurements; Dielectric thin films; Equations; Impedance; Measurement techniques; Permittivity measurement; Resonant frequency;
Conference_Titel :
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
1-4244-0123-2
DOI :
10.1109/APS.2006.1710824
