Title :
Deterministic and continuous control of the threshold voltage and noise margin of organic thin-film transistors and organic complementary circuits using mixed phosphonic acid self-assembled monolayer gate dielectrics
Author :
Zschieschang, Ute ; Ante, Frederik ; Schlörholz, Matthias ; Kern, Klaus ; Klauk, Hagen
Author_Institution :
Max Planck Inst. for Solid State Res., Stuttgart, Germany
Abstract :
For many applications of organic thin-film transistors (TFTs), high-capacitance gate dielectrics that can be processed at low temperature are of interest. Several approaches exist, including vapor-deposited metal oxides, ultra-thin polymers, self-assembled nanodielectrics, and thin hybrid dielectrics based on alkyl phosphonic acid self-assembled monolayers (SAMs) on plasma-oxidized aluminum gates. None of these approaches, however, provides deterministic and continuous control of the threshold voltage. A few reports of low-voltage (¿5 V) organic complementary circuits with symmetric switching threshold and large noise margins exist, but the TFTs were not air-stable and had to be operated in an inert gas, which is not practical for real applications. Here we show how the threshold voltage of air-stable, low-voltage organic TFTs and the switching threshold and noise margin of air-stable, low-voltage, low-power organic complementary circuits can be reproducibly tuned over a wide range by using a mixed alkyl/fluoroalkyl phosphonic acid self-assembled monolayer (SAM) as a high-capacitance gate dielectric.
Keywords :
dielectric materials; thin film transistors; alkyl phosphonic acid self-assembled monolayers; fluoroalkyl phosphonic acid self-assembled monolayer; high-capacitance gate dielectrics; low-voltage organic complementary circuits; noise margin; organic complementary circuits; organic thin-film transistors; phosphonic acid self-assembled monolayer gate dielectrics; plasma-oxidized aluminum gates; self-assembled nanodielectrics; symmetric switching threshold; thin hybrid dielectrics; threshold voltage; ultra-thin polymers; vapor-deposited metal oxides; Circuit noise; Dielectrics; Organic thin film transistors; Plasma temperature; Polymers; Self-assembly; Switching circuits; Thin film transistors; Threshold voltage; Voltage control;
Conference_Titel :
Device Research Conference, 2009. DRC 2009
Conference_Location :
University Park, PA
Print_ISBN :
978-1-4244-3528-9
Electronic_ISBN :
978-1-4244-3527-2
DOI :
10.1109/DRC.2009.5354940