• DocumentCode
    2693687
  • Title

    Narrow band gap III–V based-FET for ultra low power high frequency analog applications

  • Author

    Dambrine, Gilles ; Bollaert, S. ; Roellens, Y. ; Noudeviwa, A. ; Danneville, F. ; Olivier, A. ; Wichmann, N. ; Desplanque, L. ; Wallart, X. ; Grahn, J. ; Moschetti, G. ; Nilsson, P. Å ; Malmkvist, M. ; Lefebvre, E.

  • Author_Institution
    Univ. of Lille 1, Villeneuve-d´´Ascq, France
  • fYear
    2009
  • fDate
    22-24 June 2009
  • Firstpage
    149
  • Lastpage
    151
  • Abstract
    For more than 30 years, III-V materials and associated transistors or integrated circuits aroused of numerous studies to achieve today an industrial reality with the availability of a panel of high performance technologies. For the development of these III-V technologies, there was no established roadmap; the line of sight was essentially the increase of the operating frequency limit (more than 300GHz) either for ultra low noise high frequency (HF) electronics, or for high power HF electronics. The interest carried to these technologies results from two fundamental aspects: the incredible variety of materials presenting excellent electronic characteristics and the discovery of the exceptional properties of heterojunctions allowing the engineering of energy bands. Four main types of III-V material systems have been investigated: GaAs, InP (InGaAs channel), InAs and a little less InSb. The main physical parameters of such materials are summarized.
  • Keywords
    III-V semiconductors; field effect transistors; narrow band gap semiconductors; III-V material systems; III-V materials; electronic characteristics; high power HF electronics; narrow band gap III-V based-FET; ultra low power high frequency analog application; Availability; Frequency; Gallium arsenide; Hafnium; Heterojunctions; III-V semiconductor materials; Indium phosphide; Integrated circuit technology; Narrowband; Power engineering and energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2009. DRC 2009
  • Conference_Location
    University Park, PA
  • Print_ISBN
    978-1-4244-3528-9
  • Electronic_ISBN
    978-1-4244-3527-2
  • Type

    conf

  • DOI
    10.1109/DRC.2009.5354961
  • Filename
    5354961