DocumentCode
2693687
Title
Narrow band gap III–V based-FET for ultra low power high frequency analog applications
Author
Dambrine, Gilles ; Bollaert, S. ; Roellens, Y. ; Noudeviwa, A. ; Danneville, F. ; Olivier, A. ; Wichmann, N. ; Desplanque, L. ; Wallart, X. ; Grahn, J. ; Moschetti, G. ; Nilsson, P. Å ; Malmkvist, M. ; Lefebvre, E.
Author_Institution
Univ. of Lille 1, Villeneuve-d´´Ascq, France
fYear
2009
fDate
22-24 June 2009
Firstpage
149
Lastpage
151
Abstract
For more than 30 years, III-V materials and associated transistors or integrated circuits aroused of numerous studies to achieve today an industrial reality with the availability of a panel of high performance technologies. For the development of these III-V technologies, there was no established roadmap; the line of sight was essentially the increase of the operating frequency limit (more than 300GHz) either for ultra low noise high frequency (HF) electronics, or for high power HF electronics. The interest carried to these technologies results from two fundamental aspects: the incredible variety of materials presenting excellent electronic characteristics and the discovery of the exceptional properties of heterojunctions allowing the engineering of energy bands. Four main types of III-V material systems have been investigated: GaAs, InP (InGaAs channel), InAs and a little less InSb. The main physical parameters of such materials are summarized.
Keywords
III-V semiconductors; field effect transistors; narrow band gap semiconductors; III-V material systems; III-V materials; electronic characteristics; high power HF electronics; narrow band gap III-V based-FET; ultra low power high frequency analog application; Availability; Frequency; Gallium arsenide; Hafnium; Heterojunctions; III-V semiconductor materials; Indium phosphide; Integrated circuit technology; Narrowband; Power engineering and energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2009. DRC 2009
Conference_Location
University Park, PA
Print_ISBN
978-1-4244-3528-9
Electronic_ISBN
978-1-4244-3527-2
Type
conf
DOI
10.1109/DRC.2009.5354961
Filename
5354961
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