Acoustic Emission in Power Semiconductor Modules—First Observations

Author

KaÌˆrkkaÌˆinen, Tommi J. ; Talvitie, Joonas P. ; Kuisma, Mikko ; Hannonen, J. ; Strom, Juha-P. ; Mengotti, Elena ; Silventoinen, Pertti

Author_Institution

Inst. of Energy Technol., Lappeenranta Univ. of Technol., Lappeenranta, Finland

Volume

29

Issue

11

fYear

2014

fDate

Nov. 2014

Firstpage

6081

Lastpage

6086

Abstract

Traditionally, condition monitoring of power semiconductor modules has been based on electrical measurements. Acoustic emission has been utilized for condition monitoring in many other applications, but is an unknown phenomenon in power semiconductor modules. In this paper, the authors present an experimental setup used to show that acoustic emission does occur because of the switching of power semiconductor components. An analysis based on propagation delays is used to determine the source of the acoustic emission.

Keywords

acoustic emission; acoustic wave propagation; condition monitoring; power semiconductor devices; acoustic emission source; condition monitoring; electrical measurement; power semiconductor module; propagation delay analysis; Acoustic emission; Acoustic measurements; Insulated gate bipolar transistors; Semiconductor device measurement; Switches; Acoustic emission; acoustic measurements; power semiconductor switches; prognostics and health management; semiconductor device reliability;

fLanguage

English

Journal_Title

Power Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0885-8993

Type

jour

DOI

10.1109/TPEL.2013.2295460

Filename

6690217