DocumentCode
2694146
Title
Centering and Tolerancing the Components of Microwave Amplifiers
Author
McFarland, A. ; Purviance, J. ; Loescher, D. ; Diegert, K. ; Ferguson, T.
Volume
2
fYear
1987
fDate
May 9 1975-June 11 1987
Firstpage
633
Lastpage
636
Abstract
A simple graphical statistical method of circuit design centering and tolerancing for a desired circuit manufacturing yield is presented. The method is iterative and based on a parametric study of circuit yield estimates using Monte Carlo circuit analysis. Circuit elements including device s-parameters and distributed parameters as well as lumped components are considered. An application of this method is given in an example.
Keywords
Circuit analysis; Circuit synthesis; Iterative methods; Manufacturing; Microwave amplifiers; Microwave devices; Monte Carlo methods; Parametric study; Statistical analysis; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location
Palo Alto, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1987.1132490
Filename
1132490
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