DocumentCode :
2694461
Title :
High Resolution Scanning Surface Potential Imaging For MR Head Development
Author :
Moreland, J. ; Russek, S.E. ; Hopkins, P.F.
Author_Institution :
National Institute of Standards and Technology
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Atomic force microscopy; Atomic measurements; Current measurement; Electronic equipment testing; Force measurement; Frequency measurement; Head; High-resolution imaging; Image resolution; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597999
Filename :
597999
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2694461
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