• DocumentCode
    2694461
  • Title

    High Resolution Scanning Surface Potential Imaging For MR Head Development

  • Author

    Moreland, J. ; Russek, S.E. ; Hopkins, P.F.

  • Author_Institution
    National Institute of Standards and Technology
  • fYear
    1997
  • fDate
    1-4 April 1997
  • Keywords
    Atomic force microscopy; Atomic measurements; Current measurement; Electronic equipment testing; Force measurement; Frequency measurement; Head; High-resolution imaging; Image resolution; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
  • Conference_Location
    New Orleans, LA, USA
  • Print_ISBN
    0-7803-3862-6
  • Type

    conf

  • DOI
    10.1109/INTMAG.1997.597999
  • Filename
    597999
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2694461