DocumentCode :
2694585
Title :
Electron microscopy experiments concerning hysteresis in the magnetic lens system
Author :
van Bree, P.J. ; van Lierop, C.M.M. ; van den Bosch, P.P.J.
Author_Institution :
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear :
2010
fDate :
8-10 Sept. 2010
Firstpage :
956
Lastpage :
961
Abstract :
Ferromagnetic hysteresis and coupled dynamics in the magnetic lens system of electron microscopes degrade the machine´s performance in terms of steady-state error and transition time. To get a clear understanding of the exact problem and the way it is expressed in the application a commercial scanning electron microscope is extended with a data-acquisition and rapid proto-typing system. By means of conditioned experiments the significance of the hysteresis effects for microscopy applications is quantified. The response is evaluated by an analysis of synchronized lens currents and estimated sharpness of the resulting images. The sensitivity of image sharpness versus input variation is obtained in a local operating point. The hysteresis effect and its coupling with dynamics, as a response to changes over the complete working range, result in a significant deviation in image sharpness. Since the magnetic field is not available for measurement, the error is expressed in the quasi-static input variation required to correct for it. In order to get a good understanding of the observed effects and the magnetic lens as a system, an interconnected dynamics-hysteresis-electron optics model is used to analyze and to reproduce the experimental results.
Keywords :
magnetic hysteresis; magnetic lenses; scanning electron microscopes; data acquisition; electron microscopy; ferromagnetic hysteresis; image sharpness; magnetic lens system; quasi-static input variation; rapid prototyping; scanning electron microscope; steady-state error; transition time; Lenses; Magnetic force microscopy; Magnetic hysteresis; Magnetic resonance imaging; Microscopy; Saturation magnetization; Trajectory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Applications (CCA), 2010 IEEE International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-5362-7
Electronic_ISBN :
978-1-4244-5363-4
Type :
conf
DOI :
10.1109/CCA.2010.5611224
Filename :
5611224
Link To Document :
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