Title :
Analysis of classification performance for Hopfield network with predefined correlated exemplar patterns
Author :
Lee, Youngjik ; Kim, Myung Won ; Song, Hyun Kyung ; Park, Sin Chong
Abstract :
The classification performance after a single iteration is derived as a function of the number of exemplar patterns, the number of processing elements in the network, input bit error probability, and inner-product values among exemplar patterns. It is shown that, when the exemplar patterns are orthogonal with each other, the correlations among the weighted sums are nothing but constant multiples of the weights. These values are rarely zero, which makes the analysis complex. However, the values of correlation reduce greatly when these weighted sums pass through the threshold. The classification performances after single and multiple iterations are derived using this method and compared with simulation results. The results can be a valuable reference in the design of Hopfield-type associative memories
Keywords :
content-addressable storage; neural nets; pattern recognition; performance evaluation; Hopfield network; classification performance; correlation reduce; inner-product values; input bit error probability; multiple iterations; predefined correlated exemplar patterns;
Conference_Titel :
Neural Networks, 1990., 1990 IJCNN International Joint Conference on
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IJCNN.1990.137668