Title :
Teaching of testing techniques: the why, what and how?
Author_Institution :
Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
Abstract :
Attempts to dispel the myth that testing is the career move for failed designers. The author stresses that design for testability is as much of a design issue as performance and functionality. He emphasises that in order to make good use of advances in VLSI technology rapid progress in the development of new testing strategies is essential. To bring about the rapid progress that is required, test engineers must be innovative and skilled; in order to keep up with advances in technology, intensive training and continued self-education is required
Keywords :
VLSI; design for testability; integrated circuit testing; training; VLSI technology; design for testability; self-education; testing strategies; testing techniques; training;
Conference_Titel :
Systems Design for Testability, IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19950550