Title :
Frequency Stability of L-Band, Two-Port Dielectric Resonator Oscillators
Author :
Loboda, M.J. ; Parker, T.E. ; Montress, G.K.
fDate :
May 9 1975-June 11 1987
Abstract :
Dielectric resonator oscillators operating at 1.5 and 2.0 GHz, based on a two-port resonator design incorporated into a basic feedback oscillator configuration were evaluated and show state-of-the-art, close-to-carrier phase noise performance. Typically, at 1 KHz carrier offset frequency the single sideband phase noise levels were -130 dBc/Hz and -120 dBc/Hz for the 1.5 GHz and 2.0 GHz oscillators, respectively. Vibration sensitivity was also investigated and the resonators show fractional frequency changes per g in the range of 10/sup -7/ to 10/sup -9/ for the 1.5 GHz and 2.0 GHz designs, respectively.
Keywords :
Dielectric measurements; Frequency; Insertion loss; L-band; Microwave oscillators; Noise measurement; Phase measurement; Phase noise; Radar cross section; Stability;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132552