• DocumentCode
    2694994
  • Title

    Frequency Stability of L-Band, Two-Port Dielectric Resonator Oscillators

  • Author

    Loboda, M.J. ; Parker, T.E. ; Montress, G.K.

  • Volume
    2
  • fYear
    1987
  • fDate
    May 9 1975-June 11 1987
  • Firstpage
    859
  • Lastpage
    862
  • Abstract
    Dielectric resonator oscillators operating at 1.5 and 2.0 GHz, based on a two-port resonator design incorporated into a basic feedback oscillator configuration were evaluated and show state-of-the-art, close-to-carrier phase noise performance. Typically, at 1 KHz carrier offset frequency the single sideband phase noise levels were -130 dBc/Hz and -120 dBc/Hz for the 1.5 GHz and 2.0 GHz oscillators, respectively. Vibration sensitivity was also investigated and the resonators show fractional frequency changes per g in the range of 10/sup -7/ to 10/sup -9/ for the 1.5 GHz and 2.0 GHz designs, respectively.
  • Keywords
    Dielectric measurements; Frequency; Insertion loss; L-band; Microwave oscillators; Noise measurement; Phase measurement; Phase noise; Radar cross section; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1987 IEEE MTT-S International
  • Conference_Location
    Palo Alto, CA, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1987.1132552
  • Filename
    1132552