Title :
Microwave Measurements of GaAs Integrated Circuits Using Electrooptic Sampling
Author :
Weingarten, K.J. ; Majidi-Ahy, R. ; Rodwell, M.J.W. ; Auld, B.A. ; Bloom, D.M.
fDate :
May 9 1975-June 11 1987
Abstract :
We describe the electrooptic sampling system at Stanford with emphasis on the requirements for microwave measurements. Results presented include internal-node measurements of 20 GHz distributed amplifiers, propagation delays in GaAs frequency dividers clocked to 18 GHz, and VSWR on IC transmission lines to 40 GHz.
Keywords :
Distributed amplifiers; Frequency conversion; Frequency measurement; Gallium arsenide; Integrated circuit measurements; Microwave integrated circuits; Microwave measurements; Propagation delay; Sampling methods; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132557
