• DocumentCode
    2695192
  • Title

    Digital techniques for testing analogue functions

  • Author

    Robson, M. ; Russell, G.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
  • fYear
    1995
  • fDate
    34815
  • Firstpage
    42522
  • Lastpage
    42525
  • Abstract
    A systems level approach to testing embedded analogue functions in VLSI circuits is described. An M-sequence generated from a digital test environment is used to produce an impulse response from an analogue circuit. The fault detection capabilities of the technique are demonstrated by using a Tow-Thomas biquad filter as an example
  • Keywords
    VLSI; biquadratic filters; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; transient response; M-sequence; Tow-Thomas biquad filter; VLSI circuits; embedded analogue functions; fault detection capabilities; impulse response; systems level approach;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Systems Design for Testability, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19950552
  • Filename
    477997
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2695192