Title :
Digital techniques for testing analogue functions
Author :
Robson, M. ; Russell, G.
Author_Institution :
Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
Abstract :
A systems level approach to testing embedded analogue functions in VLSI circuits is described. An M-sequence generated from a digital test environment is used to produce an impulse response from an analogue circuit. The fault detection capabilities of the technique are demonstrated by using a Tow-Thomas biquad filter as an example
Keywords :
VLSI; biquadratic filters; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; transient response; M-sequence; Tow-Thomas biquad filter; VLSI circuits; embedded analogue functions; fault detection capabilities; impulse response; systems level approach;
Conference_Titel :
Systems Design for Testability, IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19950552
