• DocumentCode
    2695260
  • Title

    Neural network model-based predictive control for multivariable nonlinear systems

  • Author

    Alamdari, Bahareh Vatankhah ; Fatehi, Alireza ; Khaki-Sedigh, Ali

  • Author_Institution
    Electr. Eng. Dept., K. N. Toosi Univ. of Technol., Tehran, Iran
  • fYear
    2010
  • fDate
    8-10 Sept. 2010
  • Firstpage
    920
  • Lastpage
    925
  • Abstract
    A nonlinear model predictive control (NMPC) algorithm based on a neural network model is proposed for multivariable nonlinear systems. A multi-input multi-output model is developed using multilayer perceptron (MLP) neural network which is trained by Levenberg-Marquardt algorithm and amplitude modulated pseudo random binary (APRBS) signals with noise as data sets. Model predictive control also uses Levenberg-Marquardt algorithm for the control signal optimization. The control performance is improved by using a disturbance model that compensates both model mismatch and external disturbance. The learning rate of disturbance estimation network changes adaptively to treat the model mismatch differently from the external disturbance. Simulation results using the quadruple-tank are employed to show the effectiveness of the method.
  • Keywords
    MIMO systems; multilayer perceptrons; multivariable control systems; neurocontrollers; nonlinear control systems; predictive control; Levenberg-Marquardt algorithm; control signal optimization; disturbance estimation network; disturbance model; modulated pseudo random binary signals; multiinput multioutput model; multilayer perceptron neural network; multivariable nonlinear systems; neural network model-based predictive control; quadruple-tank; Artificial neural networks; MIMO; Optimization; Prediction algorithms; Predictive control; Predictive models; Steady-state; Disturbance rejection; MLP neural network; Multi-input multioutput; Nonlinear predictive control; Quadruple tank process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications (CCA), 2010 IEEE International Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-5362-7
  • Electronic_ISBN
    978-1-4244-5363-4
  • Type

    conf

  • DOI
    10.1109/CCA.2010.5611265
  • Filename
    5611265