Title :
Ultra Wide Swath Imaging with Multi-Channel ScanSAR
Author :
Gebert, Nicolas ; Krieger, Gerhard ; Younis, Marwan ; Bordoni, Federica ; Moreira, Alberto
Author_Institution :
German Aerosp. Center (DLR), Microwaves & Radar Inst., Wessling
Abstract :
Multi-channel synthetic aperture radar (SAR) systems enable high-resolution wide-swath imagery thus overcoming the inherent limitation of conventional SAR. A possible realization based on the combination of multi-aperture SAR signal reconstruction in azimuth with digital beamforming on receive in elevation is given in [1]. The present paper turns focus to advanced concepts for the imaging of even wider swaths while still providing high azimuth resolution [2]. In this regard, the operation of multi-channel SAR systems in burst modes like ScanSAR or TOPS is introduced and aspects of applying the multi-aperture reconstruction algorithm to burst mode data are analyzed. The influence of the digital processing network on performance parameters as signal-to-noise-ratio and azimuth ambiguity-to-signal-ratio in multi-channel burst mode systems is considered and embedded in the design example of a ScanSAR system that allows for the imaging of a 400 km wide swath with a geometric resolution of 5 m. Finally, first results for a multi-channel TOPS system are presented and an optimized TOPS processing approach is introduced.
Keywords :
radar signal processing; synthetic aperture radar; azimuth ambiguity; azimuth resolution; burst mode SAR; burst mode data; digital processing network; high resolution wide swath imagery; multiaperture reconstruction algorithm; multichannel ScanSAR operation; multichannel TOPS system; optimized TOPS processing approach; size 400 km; synthetic aperture radar; ultrawide swath imaging; Array signal processing; Azimuth; Data analysis; Focusing; High-resolution imaging; Image resolution; Reconstruction algorithms; Signal reconstruction; Signal resolution; Synthetic aperture radar;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4780017