DocumentCode :
2696488
Title :
An improved 60 GHz open resonator system for accurate measurement of dielectric permittivity
Author :
Afsar, Mohammed N. ; Chen, Shu ; Wang, Yong
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
fYear :
2005
fDate :
3-8 July 2005
Firstpage :
427
Abstract :
There has been considerable interest in Fabry-Perot open resonator methods for the measurements of ultra low-loss dielectric materials in the millimeter wave ranges. This paper is devoted to this improvement of our existing 60 GHz open resonator system. This results in more accurate measurements in comparison with some previously published data for selected dielectric materials. We have developed an improved Fabry-Perot open resonator system operating at 60 GHz using a new cavity-length variation technique. We made systematic progress in both hardware and software, thus this system is now able to provide a 10 nm resolution in the cavity length movement. Compared to a 20 nm resolution we constructed previously, this improvement guarantees a better and more accurate system to measure the permittivity and loss tangent of dielectric materials.
Keywords :
Fabry-Perot resonators; cavity resonators; dielectric loss measurement; microwave measurement; millimetre wave measurement; permittivity measurement; 60 GHz; Fabry-Perot open resonator methods; cavity-length variation technique; dielectric loss tangent; dielectric permittivity; measurement accuracy; measurement resolution; millimeter wave range; open resonator system; ultra low-loss dielectric materials measurements; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Fabry-Perot; Hardware; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Software systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
Type :
conf
DOI :
10.1109/APS.2005.1552842
Filename :
1552842
Link To Document :
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