• DocumentCode
    2696505
  • Title

    A new noise tolerance approach by using sigma-delta modulation

  • Author

    Huang, Der-Chen ; Chuang, Po-Chieh ; Chu, Ying-Yi

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Nat. Chung-Hsing Univ., Taichung, Taiwan
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    748
  • Lastpage
    753
  • Abstract
    In this paper, we developed a noise tolerance approach by using sigma-delta modulation, which can recover the noisy signals. Beside most of the previously schemes based on solving Single Event Upset (SEU), our approach can cope with the case of multiple faults, even the noise has been continued for a long time. The other property of our method is that no need to modify the original circuit and thus the performance of original circuit itself can be maintained. Meanwhile, an optimal Over Sampling Rate (OSR) has been proposed to obtain a minimum deviation between original and restore signals. In this experiment, we have assumed that a circuit output signal is affected by noises, and the total noise energy is about 0~50% of the original signal, then using our approach can produce a restore signal with a deviation under 2% of the original signal.
  • Keywords
    sigma-delta modulation; tolerance analysis; noise tolerance approach; noisy signal; over sampling rate; sigma delta modulation; single event upset; Circuit faults; Circuit noise; Delta-sigma modulation; Digital signal processing; Sampling methods; Signal restoration; Single event upset; DSP; Noise; SEU; Sigma-Delta; Soft Error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488655
  • Filename
    5488655