DocumentCode
2696642
Title
Suspect-Adapted MAP Estimation of Within-Source Distributions in Generative Likelihood Ratio Estimation
Author
Ramos-Castro, Daniel ; Gonzalez-Rodriguez, Joaquin ; Montero-Asenjo, Alberto ; Ortega-Garcia, Javier
Author_Institution
ATVS, Univ. Autonoma de Madrid
fYear
2006
fDate
28-30 June 2006
Firstpage
1
Lastpage
5
Abstract
In this paper, a novel suspect-adaptive technique for robust Bayesian forensic speaker recognition via maximum a posteriori (MAP) estimation is presented, which addresses likelihood ratio (LR) computation in limited suspect speech data conditions obtaining good calibration performance. Robustness is achieved by the use of speaker-independent information, adapting it to the specificities of the suspect involved in the process. Thus, this procedure allows the system to weight the relevance of the suspect specificities depending on the amount of suspect data available via MAP estimation. Experimental results show robustness to suspect data scarcity and stable performance for any amount of suspect material. Also, the proposed technique outperforms other previously proposed non-adaptive approaches. Results are presented as discrimination capabilities (DET plots), distributions of LRs (Tippett plots) and expected cost of wrong decisions over any prior or decision cost (Cllr). The use of such evaluation metrics allows us to highlight the importance of LR calibration in the performance of a forensic system
Keywords
Bayes methods; adaptive estimation; calibration; maximum likelihood estimation; speaker recognition; Bayesian forensic speaker recognition; MAP; calibration performance; discrimination capability; likelihood ratio computation; maximum aposteriori estimation; nonadaptive approach; source distribution; speech data; suspect-adaptive technique; Bayesian methods; Calibration; Costs; Forensics; HDTV; Robustness; Signal generators; Signal processing; Speaker recognition; Speech processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Speaker and Language Recognition Workshop, 2006. IEEE Odyssey 2006: The
Conference_Location
San Juan
Print_ISBN
1-424400471-1
Electronic_ISBN
1-4244-0472-X
Type
conf
DOI
10.1109/ODYSSEY.2006.248090
Filename
4013507
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